Current Distribution, Resistance, and Inductance for Superconducting Strip Transmission Lines

被引：179

作者：

Sheen, David M. ^{[1
,2
]}

Ali, Sami M. ^{[1
,2
]}

Oates, Daniel E. ^{[3
]}

Withers, Richard S. ^{[4
]}

Kong, J. A. ^{[1
,2
]}

机构：

[1] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA

[2] MIT, Elect Res Lab, Cambridge, MA 02139 USA

[3] MIT, Lincoln Lab, Lexington, MA 02173 USA

[4] MIT, Lincoln Lab, Analog Device Technol Grp, Lexington, MA 02173 USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 1991年 / 1卷 / 02期

关键词：

D O I：

10.1109/77.84617

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A method for the calculation of the current distribution, resistance, and inductance matrices for a system of coupled superconducting transmission lines having finite rectangular cross-section is presented. These calculations allow accurate characterization of both high-T-c and low-T-c superconducting strip transmission lines. For a single stripline geometry with finite ground planes, the current distribution, resistance, inductance, and kinetic inductance are calculated as a function of the penetration depth for various film thicknesses. These calculations are then used to determine the penetration depth for Nb, NbN, and YBa2Cu3O7-x superconducting thin films from the measured temperature dependence of the resonant frequency of a stripline resonator. The calculations are also used to convert measured temperature dependence of the quality factor to the intrinsic surface resistance as a function of temperature for an Nb stripline resonator.

引用

页码：108 / 115

页数：8

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