X-RAY SPECTROMETRY

被引：8

作者：

MARKOWICZ, AA ^{[1
]}

VANGRIEKEN, RE ^{[1
]}

机构：

[1] UNIV INSTELLING ANTWERP,GRAD SCH,DEPT CHEM,B-2610 WILRIJK,BELGIUM

来源：

ANALYTICAL CHEMISTRY | 1990年 / 62卷 / 12期

关键词：

D O I：

10.1021/ac00211a001

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

[No abstract available]

引用

页码：R101 / R113

页数：13

共 328 条

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[2]

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[8] A NEW METHOD (METHOD OF ALPHA-PARAMETERS) FOR CORRECTING PIXE MEASUREMENTS FOR MATRIX EFFECTS IN INFINITELY THICK SAMPLES [J].

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[9]

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[10] SURFACE-FILM AND INTERFACIAL ANALYSIS VIA VARIABLE GRAZING EXIT ANGLE X-RAY-FLUORESCENCE SPECTROMETRY [J].

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APPLIED SURFACE SCIENCE, 1988, 31 (01) :1-41

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