NEW TIME-OF-FLIGHT TECHNIQUE FOR MEASURING DRIFT VELOCITY IN SEMICONDUCTORS

被引：6

作者：

EVANS, AGR

STUBBS, MG

ROBSON, PN

机构：

来源：

ELECTRONICS LETTERS | 1972年 / 8卷 / 08期

关键词：

D O I：

10.1049/el:19720142

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：195 / +

页数：1

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共 5 条

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