OPTICAL-CONSTANTS OF CUPRIC OXIDE FROM 450 TO 800 MU

The wavelength dependence of the optical constants of cupric oxide films was determined over the range 450 to 800 m mu from the transmittance measured on 12 films from 350 to 1800 A thick. The film thickness was determined by the use of a quartz crystal oscillator. Computerized techniques were used to obtain the transmittance data, carry out the analysis, and determine the calibration constant of the oscillator. It was assumed that the optical constants are independent of film thickness within this thickness range. This investigation was initiated as part of a long term study of the oxidation of thin copper films.