A DIFFERENTIAL INTERFEROMETER FOR FORCE MICROSCOPY

被引：142

作者：

SCHONENBERGER, C

ALVARADO, SF

机构：

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1989年 / 60卷 / 10期

关键词：

D O I：

10.1063/1.1140543

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：3131 / 3134

页数：4

共 13 条

[1]

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BINNIG, G ;

SMITH, DPE .

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[4]

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[5] ATOMIC FORCE MICROSCOPY USING OPTICAL INTERFEROMETRY [J].

ERLANDSSON, R ;

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MATE, CM ;

CHIANG, S .

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[6]

KINGSTON RH, 1978, DETECTION OPTICAL IN

[7]

MARKOSCH G, 1984, APPL OPTICS, V23, P4544

[8] MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J].

MARTIN, Y ;

WICKRAMASINGHE, HK .

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[9] CORRECTION [J].

MEYER, G .

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[10]

Nomarski G, 1955, J PHYS RADIUM, V16, P95

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