DYNAMIC RHEED CALCULATIONS OF RELAXATION ON AU(110)-2X1 RECONSTRUCTION

被引：3

作者：

BONEVICH, JE ^{[1
]}

MA, Y ^{[1
]}

MARKS, LD ^{[1
]}

机构：

[1] NORTHWESTERN UNIV,DEPT MAT SCI & ENGN,EVANSTON,IL 60208

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1991年 / 47卷

关键词：

D O I：

10.1107/S0108767391006402

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Dynamical calculations of reflection high-energy electron diffraction (RHEED) from the 2 x 1 missing row reconstruction of the Au(110) surface have been simulated as a function of surface-atom relaxation at different incident glancing angles using the multislice approach with the edge-patching method. The results demonstrate that the diffracted-beam intensity is extremely sensitive to the surface structure; small surface relaxations lead to large amplitude changes, which is consistent with similar claims by previous authors using different methods. The high surface sensitivity of RHEED indicates that it can be used to fingerprint surface relaxations if a reliable simulation tool is available.

引用

页码：789 / 794

页数：6

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