GENERALIZED WANNIER FUNCTIONS AT INTERFACES - STACKING-FAULTS IN SILICON

被引：20

作者：

SANCHEZDEHESA, J ^{[1
]}

VERGES, JA ^{[1
]}

TEJEDOR, C ^{[1
]}

机构：

[1] UNIV AUTONOMA MADRID,INST FIS ESTADO SOLIDO,MADRID 34,SPAIN

来源：

PHYSICAL REVIEW B | 1981年 / 24卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.24.1006

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1006 / 1013

页数：8

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