DECONVOLUTION IN COMPTON PROFILE MEASUREMENTS

被引：88

作者：

PAATERO, P ^{[1
]}

MANNINEN, S ^{[1
]}

PAAKKARI, T ^{[1
]}

机构：

[1] UNIV HELSINKI,DEPT PHYS,SF-00170 HELSINKI 17,FINLAND

来源：

PHILOSOPHICAL MAGAZINE | 1974年 / 30卷 / 06期

关键词：

D O I：

10.1080/14786437408207281

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1281 / 1294

页数：14

共 14 条

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[7]

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[8]

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[9] X-RAY DETERMINATION OF ELECTRON MOMENTA IN LI,BE,B,NA,MG,AL AND LIF [J].

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[10] GAMMA-RAY COMPTON PROFILES OF DIAMOND, SILICON, AND GERMANIUM [J].

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