A FINE-LINE NMOS IC FOR RASTER-SCAN CONTROL OF A 500-MHZ ELECTRON-BEAM DEFLECTION SYSTEM

[1] FRASER DL, 1981, SEP EUR SOL STAT CIR, P202

[2] LIN HC, 1975, IEEE J SOLID-ST CIRC, VSC10, P106

[3] Mead C., 1980, INTRO VLSI SYSTEMS

[4] DELAY-TIME OPTIMIZATION FOR DRIVING AND SENSING OF SIGNALS ON HIGH-CAPACITANCE PATHS OF VLSI SYSTEMS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) : 462 - 470

[5] POST HU, 1980, IEEE J SOLID-ST CIRC, V15, P295, DOI 10.1109/JSSC.1980.1051387

[6] HIGH-SPEED NMOS CIRCUITS MADE WITH X-RAY-LITHOGRAPHY AND REACTIVE SPUTTER ETCHING [J]. ELECTRON DEVICE LETTERS, 1980, 1 (01): : 10 - 11

[1] FRASER DL, 1981, SEP EUR SOL STAT CIR, P202

[2] LIN HC, 1975, IEEE J SOLID-ST CIRC, VSC10, P106

[3] Mead C., 1980, INTRO VLSI SYSTEMS

[4] DELAY-TIME OPTIMIZATION FOR DRIVING AND SENSING OF SIGNALS ON HIGH-CAPACITANCE PATHS OF VLSI SYSTEMS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) : 462 - 470

[5] POST HU, 1980, IEEE J SOLID-ST CIRC, V15, P295, DOI 10.1109/JSSC.1980.1051387

[6] HIGH-SPEED NMOS CIRCUITS MADE WITH X-RAY-LITHOGRAPHY AND REACTIVE SPUTTER ETCHING [J]. ELECTRON DEVICE LETTERS, 1980, 1 (01): : 10 - 11