共 21 条
ULTRAFAST BEAM-DEFLECTION METHOD AND ITS APPLICATION FOR MEASURING THE TRANSIENT REFRACTIVE-INDEX OF MATERIALS
被引:23
作者:
ALBRECHT, HS
HEIST, P
KLEINSCHMIDT, J
LAP, DV
机构:
[1] FRIEDRICH SCHILLER UNIV JENA,MAX PLANCK ARBEITSGRP RONTGENOPT,D-07743 JENA,GERMANY
[2] LAMBDA PHYS GMBH,D-37079 GOTTINGEN,GERMANY
来源:
APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY
|
1993年
/
57卷
/
03期
关键词:
D O I:
10.1007/BF00334534
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We represent an ultrafast beam-deflection method as a simple and powerful tool for the time-resolved measurement of induced changes of the refractive index in the order of DELTAn = 10(-5). The method is applied for measuring the changes of components of the refractive index parallel and perpendicular to the pump-pulse polarization on a femtosecond time scale. Fused silica and CS2 are used as samples for demonstrating our method.
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页码:193 / 197
页数:5
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