ULTRAFAST BEAM-DEFLECTION METHOD AND ITS APPLICATION FOR MEASURING THE TRANSIENT REFRACTIVE-INDEX OF MATERIALS

被引：23

作者：

ALBRECHT, HS

HEIST, P

KLEINSCHMIDT, J

LAP, DV

机构：

[1] FRIEDRICH SCHILLER UNIV JENA,MAX PLANCK ARBEITSGRP RONTGENOPT,D-07743 JENA,GERMANY

[2] LAMBDA PHYS GMBH,D-37079 GOTTINGEN,GERMANY

来源：

APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY | 1993年 / 57卷 / 03期

关键词：

D O I：

10.1007/BF00334534

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We represent an ultrafast beam-deflection method as a simple and powerful tool for the time-resolved measurement of induced changes of the refractive index in the order of DELTAn = 10(-5). The method is applied for measuring the changes of components of the refractive index parallel and perpendicular to the pump-pulse polarization on a femtosecond time scale. Fused silica and CS2 are used as samples for demonstrating our method.

引用

页码：193 / 197

页数：5