CHARACTERIZATION OF SPUTTERED GOLD-TUNGSTEN AND GOLD-MOLYBDENUM METALLIZATIONS FOR MICROWAVE-POWER TRANSISTORS

被引:1
作者
CHRISTOU, A [1 ]
DAY, HM [1 ]
机构
[1] USN,RES LAB,WASHINGTON,DC 20375
来源
IEEE TRANSACTIONS ON PARTS HYBRIDS AND PACKAGING | 1973年 / PHP9卷 / 04期
关键词
D O I
10.1109/TPHP.1973.1136739
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:224 / 229
页数:6
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