NONDESTRUCTIVE DETERMINATION OF IN-DEPTH PROFILE OF BRASS

被引：9

作者：

ASAMI, K

机构：

来源：

TRANSACTIONS OF THE JAPAN INSTITUTE OF METALS | 1980年 / 21卷 / 05期

关键词：

D O I：

10.2320/matertrans1960.21.302

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

A non-destructive analytical method for determination of the in-depth composition profile over a range from 1 nm to 10 mu m is developed for alpha -brass, combining X-ray induced AES (XAES), EPMA and X-ray diffraction (XD).

引用

页码：302 / 308

页数：7

共 13 条

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