INTERACTIVE ELECTRON-ENERGY-LOSS ELEMENTAL MAPPING BY THE IMAGING-SPECTRUM METHOD

被引:62
作者
LAVERGNE, JL [1 ]
MARTIN, JM [1 ]
BELIN, M [1 ]
机构
[1] KODAK, PATHE, ANAL LAB, ZI NORD, F-71102 CHALON SUR SAONE, FRANCE
来源
MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1992年 / 3卷 / 06期
关键词
D O I
10.1051/mmm:0199200306051700
中图分类号
TH742 [显微镜];
学科分类号
摘要
We have developed a method which performs chemical imaging with great interactivity between a selected filtered image and the EELS spectrum of a specimen or of a selected area of this specimen. This method, called ''Imaging-Spectrum'', uses the capabilities of the Energy Filtering Transmission Electron Microscopy (EFTEM) fitted with a personal computer. The experiments are performed with a ZEISS CEM 902 coupled with a KONTRON image analysis system. A software has been developed which allows off-line work with an IBM AT Comparison is made between this method and the Spectrum-Imaging technique and the future of filtered imaging is discussed. Experiments were carried out to show the spectral and spatial resolution of this method and dose calculations were achieved. We demonstrate that such a technique is of interest for fast high resolution chemical mapping.
引用
收藏
页码:517 / 528
页数:12
相关论文
共 18 条
  • [1] PARALLEL EELS ELEMENTAL MAPPING IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPY - USE OF THE DIFFERENCE-METHODS
    BALOSSIER, G
    THOMAS, X
    MICHEL, J
    WAGNER, D
    BONHOMME, P
    PUCHELLE, E
    PLOTON, D
    BONHOMME, A
    PINON, JM
    [J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1991, 2 (05): : 531 - 546
  • [2] CASTAING R, 1962, CR HEBD ACAD SCI, V255, P76
  • [3] THE IMPACT OF EELS IN MATERIALS SCIENCE
    COLLIEX, C
    [J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1991, 2 (2-3): : 403 - 411
  • [4] COLLIEX C, 1982, MICROSC SPECTROSC EL, V7, P525
  • [5] EGERTON RF, 1986, ELECTRON LOSS SPECTR
  • [6] INVESTIGATION AND USE OF PLASMON LOSSES IN ENERGY-FILTERING TRANSMISSION ELECTRON-MICROSCOPY
    FROMM, I
    REIMER, L
    RENNEKAMP, R
    [J]. JOURNAL OF MICROSCOPY, 1992, 166 : 257 - 271
  • [7] ELECTRON ENERGY-LOSS SPECTRUM-IMAGING
    HUNT, JA
    WILLIAMS, DB
    [J]. ULTRAMICROSCOPY, 1991, 38 (01) : 47 - 73
  • [8] SPECTRUM-IMAGE - THE NEXT STEP IN EELS DIGITAL ACQUISITION AND PROCESSING
    JEANGUILLAUME, C
    COLLIEX, C
    [J]. ULTRAMICROSCOPY, 1989, 28 (1-4) : 252 - 257
  • [9] DEVELOPMENTS IN EELS INSTRUMENTATION FOR SPECTROSCOPY AND IMAGING
    KRIVANEK, OL
    GUBBENS, AJ
    DELLBY, N
    [J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1991, 2 (2-3): : 315 - 332
  • [10] PARALLEL DETECTION ELECTRON SPECTROMETER USING QUADRUPOLE LENSES
    KRIVANEK, OL
    AHN, CC
    KEENEY, RB
    [J]. ULTRAMICROSCOPY, 1987, 22 (1-4) : 103 - 115