PARALLEL DETECTION ELECTRON SPECTROMETER USING QUADRUPOLE LENSES

被引：164

作者：

KRIVANEK, OL

AHN, CC

KEENEY, RB

机构：

[1] Gatan Inc, Pleasanton, CA, USA, Gatan Inc, Pleasanton, CA, USA

来源：

关键词：

D O I：

10.1016/0304-3991(87)90054-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：103 / 115

页数：13

共 18 条

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[J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1984, 1 (01): : 37 - 52
[4] EGERTON RF, 1981, 39TH P EMSA M BAT RO, P368
[5] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS
ISAACSON, M
JOHNSON, D
[J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52
[6] JOHNSON DE, 1981, 39TH P ANN M EL MICR, P370
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[8] KRAUS B, 1986, IN PRESS 11TH P INT
[9] Krivanek O.L., 1981, QUANTITATIVE MICROAN, P136
[10] KRIVANEK OL, UNPUB