SIMPLE ELECTRON SPECTROMETER FOR ENERGY ANALYSIS IN TRANSMISSION MICROSCOPE

被引：34

作者：

EGERTON, RF

机构：

来源：

ULTRAMICROSCOPY | 1978年 / 3卷 / 01期

关键词：

D O I：

10.1016/S0304-3991(78)80005-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：39 / 47

页数：9

共 29 条

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EGERTON, RF ;

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[9] DIRECT MEASUREMENT OF CONTAMINATION AND ETCHING RATES IN AN ELECTRON-BEAM [J].

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