OBSERVATION OF FLUX LINES BY ELECTRON HOLOGRAPHY

被引：4

作者：

TONOMURA, A ^{[1
]}

机构：

[1] JRDC, ERATO, ELECTRON WAVEFRONT PROJECT, HATOYAMA, SAITAMA 3500, JAPAN

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1993年 / 29卷 / 06期

关键词：

D O I：

10.1109/20.280974

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The wave nature of electrons is utilized through electron holography to directly observe magnetic flux lines, as an electron interference micrograph, with a ''coherent'' field-emission electron beam. This technique is applied to magnetic domain structure observation of a ferromagnetic thin film and also to the direct observation of flux lines penetrating a superconducting thin film.

引用

页码：2488 / 2493

页数：6

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