QUANTITATIVE ANALYSIS WITH THE X-RAY SPECTROMETER - ACCURACY AND REPRODUCIBILITY

被引:22
作者
KLUG, HP
ALEXANDER, L
KUMMER, E
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关键词
D O I
10.1021/ac60019a003
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
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页码:607 / 609
页数:3
相关论文
共 5 条
[1]   Quantitative analysis of mine dusts - An x-ray diffraction method [J].
Clark, GL ;
Reynolds, DH .
INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1936, 8 :36-40
[2]  
FRIEDMAN H, 1945, ELECTRONICS, V18, P132
[3]   Chemical analysis by x-ray diffraction - Classification and use of x-ray diffraction patterns [J].
Hanawalt, JD ;
Rinn, HW ;
Frevel, LK .
INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1938, 10 :0457-0512
[4]   A new method of chemical analysis [J].
Hull, AW .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1919, 41 :1168-1175
[5]  
KLUG HP, IN PRESS J IND HYG T