ANALYSES AND CORRECTIONS OF INSTRUMENTAL ERRORS IN ELLIPSOMETRY

被引：66

作者：

MCCRACKIN, FL

机构：

来源：

关键词：

D O I：

10.1364/JOSA.60.000057

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：57 / +

页数：1

共 14 条

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ARCHER, RJ
SHANK, CV
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (02) : 191 - &
[2] Drude P., 1889, ANN PHYS-NEW YORK, V272, P865
[3] Drude P., 1890, PHYS CHEM, V39, P481, DOI [10.1002/andp.18902750402, DOI 10.1002/ANDP.18902750402]
[4] Drude P, 1889, ANN PHYS CHEM, V272, P532
[5] FORMULAS FOR USING WAVE PLATES IN ELLIPSOMETRY
HOLMES, DA
FEUCHT, DL
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (04) : 466 - +
[6] MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY
MCCRACKIN, FL
PASSAGLIA, E
STROMBERG, RR
STEINBERG, HL
[J]. JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY, 1963, A 67 (04): : 363 - +
[7] MCCRACKIN FL, 1961, 256 US NATL BUR STD, P61
[8] MCCRACKIN FL, 1969, 479 NATL BUR STD US
[9] ELLIPSOMETRY USING A RETARDATION PLATE AS COMPENSATOR
OLDHAM, WG
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1967, 57 (05) : 617 - &
[10] ONEILL EL, 1963, INTRODUCTION STATIST, P133