OPTIMUM DEFOCUS FOR STEM IMAGING AND MICROANALYSIS

[1] Butler J. H., 1983, ULTRAMICROSCOPY, V12, P39

[2] AN ILLUSTRATED REVIEW OF VARIOUS FACTORS GOVERNING THE HIGH SPATIAL-RESOLUTION CAPABILITIES IN EELS MICROANALYSIS [J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 131 - 150

[3] COLLIEX C, 1984, SCOTTISH U SUMMER SC, V25, P149

[4] COHERENT INTERFERENCE EFFECTS IN SIEM AND CBED [J]. ULTRAMICROSCOPY, 1981, 7 (01) : 19 - 26

[5] SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF THIN SPECIMENS [J]. ULTRAMICROSCOPY, 1976, 2 (01) : 3 - 16

[6] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1969, 15 (02) : 58 - &

[7] COWLEY JM, 1978, SCANNING ELECTRON MI, V1, P53

[8] COWLEY JM, 1981, DIFFRACTION PHYSICS, pCH13

[9] VISIBILITY OF SINGLE ATOMS [J]. SCIENCE, 1970, 168 (3937) : 1338 - &

[10] CREWE AV, 1973, PROGR OPTICS, V11, P225

[1] Butler J. H., 1983, ULTRAMICROSCOPY, V12, P39

[2] AN ILLUSTRATED REVIEW OF VARIOUS FACTORS GOVERNING THE HIGH SPATIAL-RESOLUTION CAPABILITIES IN EELS MICROANALYSIS [J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 131 - 150

[3] COLLIEX C, 1984, SCOTTISH U SUMMER SC, V25, P149

[4] COHERENT INTERFERENCE EFFECTS IN SIEM AND CBED [J]. ULTRAMICROSCOPY, 1981, 7 (01) : 19 - 26

[5] SCANNING-TRANSMISSION ELECTRON-MICROSCOPY OF THIN SPECIMENS [J]. ULTRAMICROSCOPY, 1976, 2 (01) : 3 - 16

[6] IMAGE CONTRAST IN A TRANSMISSION SCANNING ELECTRON MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1969, 15 (02) : 58 - &

[7] COWLEY JM, 1978, SCANNING ELECTRON MI, V1, P53

[8] COWLEY JM, 1981, DIFFRACTION PHYSICS, pCH13

[9] VISIBILITY OF SINGLE ATOMS [J]. SCIENCE, 1970, 168 (3937) : 1338 - &

[10] CREWE AV, 1973, PROGR OPTICS, V11, P225