APPLICABILITY OF THE DIFFERENTIAL X-RAY ABSORPTION METHOD TO THE DETERMINATIONS OF FOIL THICKNESS AND LOCAL COMPOSITION IN THE ANALYTICAL ELECTRON-MICROSCOPE

被引：42

作者：

HORITA, Z

ICHITANI, K

SANO, T

NEMOTO, M

机构：

来源：

PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1989年 / 59卷 / 05期

关键词：

D O I：

10.1080/01418618908209829

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：939 / 952

页数：14

共 18 条

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[2]

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[3]

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[4]

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[5]

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[6] SIMPLIFICATION OF X-RAY ABSORPTION CORRECTION IN THIN-SAMPLE QUANTITATIVE MICROANALYSIS [J].

HORITA, Z ;

SANO, T ;

NEMOTO, M .

ULTRAMICROSCOPY, 1987, 21 (03) :271-276

[7]

JACOBS MH, 1972, 5TH P EUR C EL MICR, P136

[8] DETERMINATION OF FOIL THICKNESS BY SCANNING-TRANSMISSION ELECTRON-MICROSCOPY [J].

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JOSTSONS, A ;

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KNOX, WA .

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[10]

Lorimer G. W., 1976, DEV ELECT MICROSCOPY, P153

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