DOMAIN REORIENTATION EFFECTS ON THE TEMPERATURE-DEPENDENCE OF PIEZOELECTRIC PROPERTIES IN PB(ZN1/3NB2/3)O3-PBTIO3-PBZRO3 CERAMICS

被引:13
作者
WI, SK
KIM, HG
机构
[1] Department of Ceramic Science and Engineering, Korea Advanced Institute of Science and Technology, Taejeon, 373-1 Kusong-dong, Yusong-gu
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1992年 / 31卷 / 9A期
关键词
DOMAIN REORIENTATION; PIEZOELECTRIC CERAMIC; TEMPERATURE DEPENDENCE;
D O I
10.1143/JJAP.31.2825
中图分类号
O59 [应用物理学];
学科分类号
摘要
For the PZN-PT-PZ ceramic system, the difference in the temperature characteristics of piezoelectric properties between the tetragonal phase and the rhombohedral one was studied from the viewpoint of a domain reorientation mechanism. From the measurement of thermal expansion and the change of high-temperature X-ray diffraction patterns for two phases, it is considered that the more stable temperature characteristics of the tetragonal phase than those of rhombohedral one originates from the stable temperature dependence of 90-degrees domain reorientation for the poled tetragonal phase. The temperature dependence of dielectric properties is more influenced by 180-degrees domain reversal for both the tetragonal and rhombohedral phase.
引用
收藏
页码:2825 / 2828
页数:4
相关论文
共 13 条
[2]   DOMAIN CLAMPING EFFECT IN BARIUM TITANATE SINGLE CRYSTALS [J].
DROUGARD, ME ;
YOUNG, DR .
PHYSICAL REVIEW, 1954, 94 (06) :1561-1564
[3]  
Isupov V.A., 1970, J PHYS SOC JPN, V28, P312
[4]  
JAFFE B, 1971, PIEZOELECTRIC CERAMI, P168
[5]  
KRUEGER HA, 1967, J ACOUST SOC AM, V42, P576
[6]  
METHA K, 1990, J AM CERAM SOC, V73, P567
[7]  
PATEL ND, 1986, AM CERAM SOC BULL, V65, P783
[8]   COMPARISON OF SURFACE AND BULK ROOM-TEMPERATURE DOMAIN-STRUCTURE OF BARIUM-TITANATE CERAMICS USING X-RAY-DIFFRACTION [J].
SETH, VK ;
GATINS, GJ ;
SCHULZE, WA .
FERROELECTRICS, 1988, 87 :243-253
[9]  
Turik A. V., 1980, Soviet Physics - Technical Physics, V25, P1251
[10]   TEMPERATURE AND BIAS CHARACTERISTICS OF PB(ZR-TI)O3 FAMILIES CERAMICS [J].
UCHIDA, N ;
IKEDA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1965, 4 (11) :867-&