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DEPTH DISTRIBUTION OF KNOCK-ON NITROGEN IN SI BY PHOSPHORUS IMPLANTATION THROUGH SI3N4 FILMS
被引:15
作者
:
HIRAO, T
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECT IND CO LTD,CENT RES LABS,MORIGUCHI,OSAKA 570,JAPAN
HIRAO, T
INOUE, K
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECT IND CO LTD,CENT RES LABS,MORIGUCHI,OSAKA 570,JAPAN
INOUE, K
TAKAYANAGI, S
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECT IND CO LTD,CENT RES LABS,MORIGUCHI,OSAKA 570,JAPAN
TAKAYANAGI, S
YAEGASHI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
MATSUSHITA ELECT IND CO LTD,CENT RES LABS,MORIGUCHI,OSAKA 570,JAPAN
YAEGASHI, Y
机构
:
[1]
MATSUSHITA ELECT IND CO LTD,CENT RES LABS,MORIGUCHI,OSAKA 570,JAPAN
[2]
MATSUSHITA ELECTR CORP,RES LAB,TAKATSUKI,OSAKA 569,JAPAN
来源
:
APPLIED PHYSICS LETTERS
|
1977年
/ 31卷
/ 08期
关键词
:
D O I
:
10.1063/1.89747
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:505 / 508
页数:4
相关论文
共 11 条
[1]
ANALYSIS OF THIN SILICA FILMS BY SECONDARY ION EMISSION
BLANCHARD, B
论文数:
0
引用数:
0
h-index:
0
BLANCHARD, B
HILLERET, N
论文数:
0
引用数:
0
h-index:
0
HILLERET, N
MONNIER, J
论文数:
0
引用数:
0
h-index:
0
MONNIER, J
[J].
MATERIALS RESEARCH BULLETIN,
1971,
6
(12)
: 1283
-
+
[2]
RESIDUAL DISORDER IN SI FROM OXYGEN RECOILS IN ANNEALED THROUGH OXIDE ARSENIC IMPLANTS
CHU, WK
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
CHU, WK
MULLER, H
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MULLER, H
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MAYER, JW
SIGMON, TW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
SIGMON, TW
[J].
APPLIED PHYSICS LETTERS,
1974,
25
(05)
: 297
-
299
[3]
CROWDER BL, 1973, 3RD P INT C ION IMPL
[4]
FURUKAWA S, 1972, J APPL PHYS, V42, P1268
[5]
ESTIMATION OF IMPURITY PROFILES IN ION-IMPLANTED AMORPHOUS TARGETS USING JOINED HALF-GAUSSIAN DISTRIBUTIONS
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD ELECT LAB,STANFORD,CA 94305
STANFORD ELECT LAB,STANFORD,CA 94305
GIBBONS, JF
MYLROIE, S
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD ELECT LAB,STANFORD,CA 94305
STANFORD ELECT LAB,STANFORD,CA 94305
MYLROIE, S
[J].
APPLIED PHYSICS LETTERS,
1973,
22
(11)
: 568
-
569
[6]
GIBBONS JF, 1975, PROJECTED RANGE STAT
[7]
MOS MEASUREMENT OF OXYGEN RECOILS FROM AS IMPLANTATION INTO SILICON DIOXIDE
GOETZBERGER, A
论文数:
0
引用数:
0
h-index:
0
机构:
INST ANGEW FESTKORPER PHYS,FREIBURG,FED REP GER
GOETZBERGER, A
BARTELINK, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
INST ANGEW FESTKORPER PHYS,FREIBURG,FED REP GER
BARTELINK, DJ
MCVITTIE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
INST ANGEW FESTKORPER PHYS,FREIBURG,FED REP GER
MCVITTIE, JP
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
机构:
INST ANGEW FESTKORPER PHYS,FREIBURG,FED REP GER
GIBBONS, JF
[J].
APPLIED PHYSICS LETTERS,
1976,
29
(04)
: 259
-
261
[8]
ISHIWARA H, 1975, ION IMPLANTATION SEM
[9]
LEWIS RK, 1975, NBS40023 SPEC PUBL
[10]
RESIDUAL DEFECTS IN SI PRODUCED BY RECOIL IMPLANTATION OF OXYGEN
MOLINE, RA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
MOLINE, RA
CULLIS, AG
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CULLIS, AG
[J].
APPLIED PHYSICS LETTERS,
1975,
26
(10)
: 551
-
553
←
1
2
→
共 11 条
[1]
ANALYSIS OF THIN SILICA FILMS BY SECONDARY ION EMISSION
BLANCHARD, B
论文数:
0
引用数:
0
h-index:
0
BLANCHARD, B
HILLERET, N
论文数:
0
引用数:
0
h-index:
0
HILLERET, N
MONNIER, J
论文数:
0
引用数:
0
h-index:
0
MONNIER, J
[J].
MATERIALS RESEARCH BULLETIN,
1971,
6
(12)
: 1283
-
+
[2]
RESIDUAL DISORDER IN SI FROM OXYGEN RECOILS IN ANNEALED THROUGH OXIDE ARSENIC IMPLANTS
CHU, WK
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
CHU, WK
MULLER, H
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MULLER, H
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
MAYER, JW
SIGMON, TW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91109
SIGMON, TW
[J].
APPLIED PHYSICS LETTERS,
1974,
25
(05)
: 297
-
299
[3]
CROWDER BL, 1973, 3RD P INT C ION IMPL
[4]
FURUKAWA S, 1972, J APPL PHYS, V42, P1268
[5]
ESTIMATION OF IMPURITY PROFILES IN ION-IMPLANTED AMORPHOUS TARGETS USING JOINED HALF-GAUSSIAN DISTRIBUTIONS
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD ELECT LAB,STANFORD,CA 94305
STANFORD ELECT LAB,STANFORD,CA 94305
GIBBONS, JF
MYLROIE, S
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD ELECT LAB,STANFORD,CA 94305
STANFORD ELECT LAB,STANFORD,CA 94305
MYLROIE, S
[J].
APPLIED PHYSICS LETTERS,
1973,
22
(11)
: 568
-
569
[6]
GIBBONS JF, 1975, PROJECTED RANGE STAT
[7]
MOS MEASUREMENT OF OXYGEN RECOILS FROM AS IMPLANTATION INTO SILICON DIOXIDE
GOETZBERGER, A
论文数:
0
引用数:
0
h-index:
0
机构:
INST ANGEW FESTKORPER PHYS,FREIBURG,FED REP GER
GOETZBERGER, A
BARTELINK, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
INST ANGEW FESTKORPER PHYS,FREIBURG,FED REP GER
BARTELINK, DJ
MCVITTIE, JP
论文数:
0
引用数:
0
h-index:
0
机构:
INST ANGEW FESTKORPER PHYS,FREIBURG,FED REP GER
MCVITTIE, JP
GIBBONS, JF
论文数:
0
引用数:
0
h-index:
0
机构:
INST ANGEW FESTKORPER PHYS,FREIBURG,FED REP GER
GIBBONS, JF
[J].
APPLIED PHYSICS LETTERS,
1976,
29
(04)
: 259
-
261
[8]
ISHIWARA H, 1975, ION IMPLANTATION SEM
[9]
LEWIS RK, 1975, NBS40023 SPEC PUBL
[10]
RESIDUAL DEFECTS IN SI PRODUCED BY RECOIL IMPLANTATION OF OXYGEN
MOLINE, RA
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
MOLINE, RA
CULLIS, AG
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
CULLIS, AG
[J].
APPLIED PHYSICS LETTERS,
1975,
26
(10)
: 551
-
553
←
1
2
→