PHOTOEMISSION SPECTROSCOPY STUDY OF THE AL/SIC INTERFACE

被引：64

作者：

PORTE, L

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1986年 / 60卷 / 02期

关键词：

D O I：

10.1063/1.337405

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：635 / 638

页数：4

共 14 条

[1] INTERFACES IN METAL MATRIX COMPOSITES [J].

ARSENAULT, RJ ;

PANDE, CS .

SCRIPTA METALLURGICA, 1984, 18 (10) :1131-1134

[2] AUGER AND ELECTRON ENERGY-LOSS STUDY OF THE AL/SIC INTERFACE [J].

BERMUDEZ, VM .

APPLIED PHYSICS LETTERS, 1983, 42 (01) :70-72

[3] STUDIES OF SIC FORMATION ON SI (100) BY CHEMICAL VAPOR-DEPOSITION [J].

BOZSO, F ;

YATES, JT ;

CHOYKE, WJ ;

MUEHLHOFF, L .

JOURNAL OF APPLIED PHYSICS, 1985, 57 (08) :2771-2778

[4] MANY-ELECTRON EFFECTS IN CORE-LEVEL X-RAY AND ELECTRON SPECTROSCOPIES FROM NA, MG, AND AL [J].

CITRIN, PH ;

WERTHEIM, GK ;

BAER, Y .

PHYSICAL REVIEW LETTERS, 1975, 35 (13) :885-888

[5]

Hedman J., 1972, Journal of Electron Spectroscopy and Related Phenomena, V1, P101, DOI 10.1016/0368-2048(72)85007-2

[6] DETERMINATION OF THE FERMI-LEVEL PINNING POSITION AT SI(111) SURFACES [J].

HIMPSEL, FJ ;

HOLLINGER, G ;

POLLAK, RA .

PHYSICAL REVIEW B, 1983, 28 (12) :7014-7018

[7] X-RAY PHOTOEMISSION SPECTRA OF CRYSTALLINE AND AMORPHOUS SI AND GE VALENCE BANDS [J].

LEY, L ;

SHIRLEY, DA ;

POLLAK, R ;

KOWALCZYK, S .

PHYSICAL REVIEW LETTERS, 1972, 29 (16) :1088-+

[8]

LEY L, 1979, TOPICS APPLIED PHYSI, V27

[9] DIAMOND SURFACE .1. STRUCTURE OF CLEAN SURFACE AND INTERACTION WITH GASES AND METALS [J].

LURIE, PG ;

WILSON, JM .

SURFACE SCIENCE, 1977, 65 (02) :453-475

[10] X-RAY PHOTOEMISSION STUDIES OF DIAMOND, GRAPHITE, AND GLASSY CARBON VALENCE BANDS [J].

MCFEELY, FR ;

KOWALCZYK, SP ;

LEY, L ;

CAVELL, RG ;

POLLAK, RA ;

SHIRLEY, DA .

PHYSICAL REVIEW B, 1974, 9 (12) :5268-5278

← 1 2 →