X-RAY SPECTROGRAPHIC DETERMINATION OF ZIRCONIUM, TUNGSTEN, VANADIUM, IRON, TITANIUM, TANTALUM, AND NIOBIUM OXIDES - APPLICATION OF THE CORRECTION FACTOR METHOD

被引：14

作者：

MITCHELL, BJ

机构：

来源：

ANALYTICAL CHEMISTRY | 1960年 / 32卷 / 12期

关键词：

D O I：

10.1021/ac60168a029

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

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页码：1652 / 1656

页数：5

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共 3 条

[1] INSTRUMENTATION FOR RAPID SPECTROCHEMICAL ANALYSIS - OPTICAL AND X-RAY EMISSION MONOCHROMATORS AND POLYCHROMATORS [J].

KEMP, JW .

ANALYTICAL CHEMISTRY, 1956, 28 (12) :1838-1843

[2] PRECISION IN X-RAY EMISSION SPECTROGRAPHY [J].

LIEBHAFSKY, HA ;

PFEIFFER, HG ;

ZEMANY, PD .

ANALYTICAL CHEMISTRY, 1955, 27 (08) :1257-1258

[3] X-RAY SPECTROPHOTOGRAPHIC DETERMINATION OF TANTALUM, NIOBIUM, IRON, AND TITANIUM OXIDE MIXTURES - USING SIMPLE ARITHMETIC CORRECTIONS FOR INTERELEMENT EFFECTS [J].

MITCHELL, BJ .

ANALYTICAL CHEMISTRY, 1958, 30 (12) :1894-1900