NEW METHOD OF CHARACTERIZING MAJORITY AND MINORITY-CARRIERS IN SEMICONDUCTORS

被引：22

作者：

LESLIEPELECKY, DL ^{[1
]}

SEILER, DG ^{[1
]}

LOLOEE, MR ^{[1
]}

LITTLER, CL ^{[1
]}

机构：

[1] TEXAS INSTRUMENTS INC,CENT RES LABS,DALLAS,TX 75265

来源：

APPLIED PHYSICS LETTERS | 1987年 / 51卷 / 23期

关键词：

D O I：

10.1063/1.98299

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1916 / 1918

页数：3

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