MISFIT DISLOCATIONS AND OTHER DEFECTS IN THIN-FILMS

被引：32

作者：

GUTKIN, MY

KOLESNIKOVA, AL

ROMANOV, AE

机构：

[1] STATE TECH UNIV,ST PETERSBURG 195251,RUSSIA

[2] MAX PLANCK INST MET RES,INST PHYS,W-7000 STUTTGART 80,GERMANY

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1993年 / 164卷 / 1-2期

关键词：

D O I：

10.1016/0921-5093(93)90707-L

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The methods and the results of calculations of the elastic properties of misfit and lattice dislocations and disclinations in thin films are considered. For one-phase films the following problems are solved: a straight edge dislocation perpendicular to the film surfaces; wedge disclinations parallel or perpendicular to the surfaces. In the case of a film on a substrate, the critical thickness for the appearance of misfit dislocations is determined in the continuum model. For multilayer films (superlattices) the effect of a reduction in the grown-in dislocation density is analysed. The behaviour of dislocations in two-phase films is also briefly reviewed.

引用

页码：433 / 437

页数：5

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PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1992, 129 (02) :363-377

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