TEM AND AES INVESTIGATIONS OF SURFACE-DIFFUSION-INDUCED AGING PROCESSES IN THIN AU FILMS ON AG(111)

被引：18

作者：

MEINEL, K

KLAUA, M

BETHGE, H

机构：

来源：

关键词：

D O I：

10.1016/0304-3991(86)90190-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：261 / 267

页数：7

共 13 条

[1] LEED INTENSITY ANALYSIS OF EPITAXIAL AG/AU SYSTEMS .2. LEED STUDY OF THE INITIAL-STAGES OF EPITAXY
AMMER, C
KLAUA, M
BETHGE, H
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 71 (02): : 415 - 428
[2] OBERFLACHENSTRUKTUREN UND KRISTALLBAUFEHLER IM ELEKTRONENMIKROSKOPISCHEN BILD, UNTERSUCHT AM NACL(II)
BETHGE, H
[J]. PHYSICA STATUS SOLIDI, 1962, 2 (07): : 775 - 820
[3] BETHGE H, 1966, ANN PHYS-BERLIN, V17, P177
[4] BETHGE H, 1964, SURF SCI, V3, P33
[5] KERN R, 1979, CURRENT TOPICS MATER, V3, P130
[6] STEP CONTRAST ON ULTRATHIN AU FILMS INVESTIGATED BY TEM
KLAUA, M
BETHGE, H
[J]. ULTRAMICROSCOPY, 1985, 17 (01) : 73 - 79
[7] IMAGING OF ATOMIC STEPS ON ULTRATHIN AU FILMS BY TEM
KLAUA, M
BETHGE, H
[J]. ULTRAMICROSCOPY, 1983, 11 (2-3) : 125 - 129
[8] KLAUA M, 1967, 2ND P C THIN FILMS B, P86
[9] KLAUA M, UNPUB
[10] MEINEL K, 1985, THESIS HALLE