EMPIRICAL-METHOD OF QUANTITATIVE-ANALYSIS IN DEPTH-SELECTIVE ME-SPECTROSCOPY

被引：26

作者：

BONCHEV, TSV ^{[1
]}

MINKOVA, A ^{[1
]}

KUSHEV, G ^{[1
]}

GROZDANOV, M ^{[1
]}

机构：

[1] UNIV SOFIA,FAC PHYS,SOFIA 1126,BULGARIA

来源：

NUCLEAR INSTRUMENTS & METHODS | 1977年 / 147卷 / 03期

关键词：

D O I：

10.1016/0029-554X(77)90391-3

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：481 / 486

页数：6

共 11 条

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EKDAHL, T ;

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[2] DEPTH SELECTION BY MEANS OF SCATTERED ELECTRONS - METHOD TO DETERMINE ELECTRON LINE PROFILES [J].

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NUCLEAR INSTRUMENTS & METHODS, 1973, 108 (03) :439-443

[3]

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[4] METHOD OF ANALYSIS OF THIN SURFACE LAYERS BY MOSSBAUER EFFECT [J].

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JORDANOV, A ;

MINKOVA, A .

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[5]

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[6]

GRUZIN PL, 1975, ATOMNAYA ENERGIYA, V38, P167

[7]

Hansen M., 1958, J ELECTROCHEM SOC, DOI DOI 10.1149/1.2428700

[8] INTERPRETATION OF RANGE MEASUREMENTS FOR KILOVOLT ELECTRONS IN SOLIDS [J].

KANTER, H ;

STERNGLASS, EJ .

PHYSICAL REVIEW, 1962, 126 (02) :620-&

[9] ANALYSIS OF BACKSCATTER MOSSBAUER-SPECTRA OBTAINED WITH INTERNAL-CONVERSION ELECTRONS [J].

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MILLER, RB .

NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (01) :93-+

[10]

MINKOVA AP, 1975, BULG J PHYS, V11, P592

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