DIRECT MEASUREMENT OF ZNGEP2 BIREFRINGENCE FROM 0.66 TO 12.2 MU-M USING POLARIZED-LIGHT INTERFERENCE

被引：51

作者：

FISCHER, DW ^{[1
]}

OHMER, MC ^{[1
]}

SCHUNEMANN, PG ^{[1
]}

POLLAK, TM ^{[1
]}

机构：

[1] LOCKHEED SANDERS INC,NASHUA,NH 03061

来源：

JOURNAL OF APPLIED PHYSICS | 1995年 / 77卷 / 11期

关键词：

D O I：

10.1063/1.359175

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The birefringence (Δn) of ZnGeP2 has been measured directly from polarized light interference spectra obtained in transmittance over the 0.66-12 μm wavelength range from samples of six different thicknesses. The Δn values were determined from the positions of fringe maxima (Δn=kλ/t) and then compared to previously published data which were obtained by a different technique. It was found that the interference fringe method results in values of Δn accurate to ±0.00005. The data are shown to exhibit much less scatter as a function of wavelength than previous results and can lead to more accurate calculations of phase-matching angles for second-harmonic generation applications. © 1995 American Institute of Physics.

引用

页码：5942 / 5945

页数：4

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