共 18 条
- [1] WORK FUNCTION, PHOTOELECTRIC THRESHOLD, AND SURFACE STATES OF ATOMICALLY CLEAN SILICON [J]. PHYSICAL REVIEW, 1962, 127 (01): : 150 - &
- [2] A DIRECT COMPARISON OF THE KELVIN AND ELECTRON BEAM METHODS OF CONTACT POTENTIAL MEASUREMENT [J]. PHYSICAL REVIEW, 1952, 88 (03): : 655 - 658
- [3] A 2 FREQUENCY VIBRATING CAPACITOR METHOD FOR CONTACT POTENTIAL DIFFERENCE MEASURMENTS [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (09): : 785 - &
- [4] BRATTAIN WH, 1953, AT&T TECH J, V32, P1
- [5] Craig P. P., 1970, Review of Scientific Instruments, V41, P258, DOI 10.1063/1.1684484
- [9] SURFACE POTENTIAL, FIELD-EFFECT MOBILITY, AND SURFACE CONDUCTIVITY OF ZNO CRYSTALS [J]. PHYSICAL REVIEW, 1959, 114 (03): : 655 - 664