X-RAY CHARACTERIZATION OF SURFACE AND BULK STRUCTURES OF SPUTTERED IRON-OXIDE THIN-FILM

被引：7

作者：

HUANG, TC ^{[1
]}

YORK, BR ^{[1
]}

机构：

[1] IBM CORP,DIV GEN PROD,SAN JOSE,CA 95123

来源：

关键词：

D O I：

10.1063/1.98208

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：389 / 391

页数：3

共 13 条

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