PIEZOREFLECTANCE AS A SUPPLEMENT TO PHOTOREFLECTANCE FOR NONDESTRUCTIVE CHARACTERIZATION OF GAAS/ALXGA1-XAS MULTIPLE QUANTUM WELLS

被引：20

作者：

TOBER, RL

SMIRL, AL

BOGGESS, TF

SCHULMAN, JN

机构：

[1] N TEXAS STATE UNIV,DEPT PHYS,CTR APPL QUANTUM ELECTR,DENTON,TX 76203

[2] HUGHES RES LABS,MALIBU,CA 90265

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 64卷 / 09期

关键词：

D O I：

10.1063/1.341251

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4678 / 4682

页数：5

共 16 条

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[3]

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[4]

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[6]

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APPLIED PHYSICS LETTERS, 1987, 50 (10) :600-602

[8] PHOTOREFLECTANCE OF GAAS/GAALAS MULTIPLE QUANTUM-WELLS - TOPOGRAPHICAL VARIATIONS IN BARRIER HEIGHT AND WELL WIDTH [J].

PARAYANTHAL, P ;

SHEN, H ;

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BEARD, WT .

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[9]

POLLAK FH, 1988, B AM PHYS SOC, V33, P278

[10] HGTE-CDTE SUPERLATTICE BAND-GAP ENHANCEMENT DUE TO INTERDIFFUSION [J].

SCHULMAN, JN ;

CHANG, YC .

APPLIED PHYSICS LETTERS, 1985, 46 (06) :571-573

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