OPTICAL CONSTANTS OF AMORPHOUS SILICON FILMS NEAR MAIN ABSORPTION EDGE

被引：36

作者：

GRIGOROVICI, R

VANCU, A

机构：

[1] Institute of Physics of the Academy, Bucharest

来源：

THIN SOLID FILMS | 1968年 / 2卷 / 1-2期

关键词：

D O I：

10.1016/0040-6090(68)90016-3

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The spectral dependence of the optical constants of amorphous silicon films near the main absorption edge shows that the energy band structure of crystalline silicon is essentially conserved after amorphization, but the absorption coefficient corresponding to indirect transitions is much increased. This is attributed to the structural disorder reigning in amorphous silicon. © 1968.

引用

页码：105 / +

页数：1

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