CONDUCTANCE NOISE INVESTIGATIONS ON SYMMETRICAL PLANAR RESISTORS WITH FINITE CONTACTS

被引：37

作者：

VANDAMME, LKJ

KUIJPER, AHD

机构：

[1] Eindhoven University of Technology, Department of Electrical Engineering, Eindhoven

来源：

SOLID-STATE ELECTRONICS | 1979年 / 22卷 / 11期

关键词：

D O I：

10.1016/0038-1101(79)90073-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Calculations and experimental results are presented of the voltage fluctuations across a pair of sensor electrodes on a planar resistor. A constant current is passed through another pair of driver electrodes. Three types of geometry are considered which are all invariant for rotations of 90°. Areas of low and high contribution to the voltage fluctuations are calculated assuming homogeneous conductivity fluctuations. The calculation method rests on the sensitivity theorem in electrical network theory. Calculations are in agreement with experimental results. © 1979.

引用

页码：981 / 986

页数：6

共 9 条

[1] DIRECTOR SW, 1975, CIRCUIT THEORY COMPU, P165
[2] LATTICE SCATTERING CAUSES 1-F NOISE
HOOGE, FN
VANDAMME, LKJ
[J]. PHYSICS LETTERS A, 1978, 66 (04) : 315 - 316
[3] KUIJPER AHD, 79E94 TH EINDH U TEC
[4] NAGEL L, M520 U CAL EL RES LA
[5] PENFIELD P, 1970, 58 TELL THEOR EL NET, P79
[6] VANBOKHOVEN WMG, 1978, AEU-INT J ELECTRON C, V32, P349
[7] CONDUCTANCE NOISE INVESTIGATIONS WITH 4 ARBITRARILY SHAPED AND PLACED ELECTRODES
VANDAMME, LKJ
VANBOKHOVEN, WMG
[J]. APPLIED PHYSICS, 1977, 14 (02): : 205 - 215
[8] CRITERIA OF LOW-NOISE THICK-FILM RESISTORS
VANDAMME, LKJ
[J]. ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1977, 4 (3-4): : 171 - 177
[9] ZHIGALSKII GP, 1977, RADIOTEKH ELEKTRON+, V22, P2610

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