AN X-RAY-DIFFRACTION STUDY ON ARTIFICIAL MULTILAYERED STRUCTURE

被引:5
作者
LIU, W
JIANG, XM
XU, C
WU, ZQ
机构
[1] Univ of Science & Technology of, China, Hefei, China, Univ of Science & Technology of China, Hefei, China
关键词
D O I
10.1016/0038-1098(88)90574-1
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
X-RAYS
引用
收藏
页码:1 / 5
页数:5
相关论文
共 6 条
[1]   SCATTERING FACTORS COMPUTED FROM RELATIVISTIC DIRAC-SLATER WAVE FUNCTIONS [J].
CROMER, DT ;
WABER, JT .
ACTA CRYSTALLOGRAPHICA, 1965, 18 :104-&
[2]   PROGRESS IN MULTILAYER DEVICES AS X-RAY OPTICAL-ELEMENTS [J].
DHEZ, P .
JOURNAL OF MICROSCOPY-OXFORD, 1985, 138 (JUN) :267-277
[3]  
GIBSON JM, 1985, MATERIALS RES SOC S, V37
[4]  
LEPTERE Y, 1983, THIN SOLID FILMS, V105, P71
[5]  
QU XQ, 1987, ACTA PHYSICA SINICA, V36, P591
[6]  
SHIA ZX, 1982, ANAL XRAY SPECTRUM, P134