RESISTIVE GATE CTD AREA-IMAGE SENSOR

被引：2

作者：

HEYNS, H

VANSANTEN, JG

机构：

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1978年 / 13卷 / 01期

关键词：

D O I：

10.1109/JSSC.1978.1050996

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：61 / 65

页数：5

共 13 条

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[10] BUCKET-BRIGADE ELECTRONICS-NEW POSSIBILITIES FOR DELAY, TIME-AXIS CONVERSION, AND SCANNING [J].

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