CHEMICAL-BONDS STUDIED WITH FUNCTIONALIZED ATOMIC-FORCE MICROSCOPY TIPS

被引：113

作者：

HAN, T ^{[1
]}

WILLIAMS, JM ^{[1
]}

BEEBE, TP ^{[1
]}

机构：

[1] UNIV UTAH,DEPT CHEM,SALT LAKE CITY,UT 84112

来源：

ANALYTICA CHIMICA ACTA | 1995年 / 307卷 / 2-3期

基金：

美国国家科学基金会;

关键词：

ATOMIC FORCE MICROSCOPY; HYDROGEN BONDS; SURFACE TECHNIQUES; THIOLS;

D O I：

10.1016/0003-2670(94)00671-8

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Chemically modified atomic force microscopy (AFM) tips were produced by using thiol molecules. A new statistical method which produces information about single chemical bond strength from the retracting part of the force-distance curves in AFM is discussed. Single hydrogen bonds between carboxylic acid groups on the tip and surface were detected, and the hydrogen bond energy between them was calculated. This measured single hydrogen bond strength shows variation in various liquid media. From the shape of the approaching part of the force-distance curves, we were able to confirm the presence of surface hydrogen bond forces, as well as infer other effects such as hydration shell and electric double-layer repulsion. The experiments represent an important step in rendering the information in AEM chemically specific.

引用

页码：365 / 376

页数：12

共 31 条

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