DEFOCUS DETERMINATION IN THE STEM BY PHASE-CONTRAST METHODS

被引：7

作者：

HAMMEL, M ^{[1
]}

COLLIEX, C ^{[1
]}

MORY, C ^{[1
]}

KOHL, H ^{[1
]}

ROSE, H ^{[1
]}

机构：

[1] UNIV PARIS 11,PHYS SOLIDES LAB,F-91405 ORSAY,FRANCE

来源：

ULTRAMICROSCOPY | 1990年 / 34卷 / 04期

关键词：

D O I：

10.1016/0304-3991(90)90019-I

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The imaging parameters of the scanning transmission electron microscope (STEM), in particular the defocus, can be obtained from a focal series of phase contrast images of an amorphous carbon film. By using a tilted specimen the phase contrast transfer characteristic (PCTC) and the mean-square contrast have been determined for a specific instrument. The PCTC contains all the information about the defocus dependence of the phase contrast. The results agree well with those obtained from a focal series of a non-tilted object and with the theoretical predictions.

引用

页码：257 / 269

页数：13

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