CONTRIBUTION TO CONTAMINATION PROBLEM IN TRANSMISSION ELECTRON-MICROSCOPY

[1] BAUER B, 1977, OPTIK, V48, P237

[2] BUHL R, 1962, OPTIK, V19, P122

[3] Curtis G. H., 1969, British Journal of Applied Physics (Journal of Physics D), V2, P1035

[4] FOURIE JT, 1975, OPTIK, V44, P111

[5] FOURIE JT, 1976, ELECTRON MICROSCOPY, V1, P396

[6] FOURIE JT, 1976, SCANNING ELECTRON MI, V1, P53

[7] HEIDE JG, 1963, Z ANGEW PHYS, V15, P116

[8] CONTAMINATION FORMED AROUND A VERY NARROW ELECTRON-BEAM [J]. ULTRAMICROSCOPY, 1976, 1 (03) : 175 - 180

[9] LEHMPFUHL G, 1975, BEITR ELEKTRON DIREK, V8, P347

[10] MAHL H, 1960, OPTIK, V17, P107

[1] BAUER B, 1977, OPTIK, V48, P237

[2] BUHL R, 1962, OPTIK, V19, P122

[3] Curtis G. H., 1969, British Journal of Applied Physics (Journal of Physics D), V2, P1035

[4] FOURIE JT, 1975, OPTIK, V44, P111

[5] FOURIE JT, 1976, ELECTRON MICROSCOPY, V1, P396

[6] FOURIE JT, 1976, SCANNING ELECTRON MI, V1, P53

[7] HEIDE JG, 1963, Z ANGEW PHYS, V15, P116

[8] CONTAMINATION FORMED AROUND A VERY NARROW ELECTRON-BEAM [J]. ULTRAMICROSCOPY, 1976, 1 (03) : 175 - 180

[9] LEHMPFUHL G, 1975, BEITR ELEKTRON DIREK, V8, P347

[10] MAHL H, 1960, OPTIK, V17, P107