STUDY ON PROTON-INDUCED X-RAY ANALYSIS AND ITS APPLICATION TO ENVIRONMENTAL SAMPLES

被引:9
作者
CHU, TC
NAVARRETE, VR
KAJI, H
IZAWA, G
SHIOKAWA, T
ISHII, K
MORITA, S
TAWARA, H
机构
[1] TOHOKU UNIV,DEPT CHEM,SENDAI,MIYAGI 980,JAPAN
[2] TOHOKU UNIV,DEPT PHYS,SENDAI,MIYAGI 980,JAPAN
[3] KYUSHU UNIV,DEPT NUCL ENGN,FUKUOKA 812,JAPAN
来源
JOURNAL OF RADIOANALYTICAL CHEMISTRY | 1977年 / 36卷 / 01期
关键词
D O I
10.1007/BF02516267
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:195 / 207
页数:13
相关论文
共 26 条
[1]  
BARNES BK, 1975, ADV XRAY ANAL, V18, P343
[2]   EXCITATION OF CHARACTERISTIC X RAYS BY PROTONS ELECTRONS + PRIMARY X RAYS [J].
BIRKS, LS ;
GROSSO, JS ;
SEEBOLD, RE ;
BATT, AP .
JOURNAL OF APPLIED PHYSICS, 1964, 35 (09) :2578-&
[3]  
CAMPBELL JL, 1974, ADV XRAY ANAL, V17, P457
[4]  
COOPER JA, 1973, BNWLSA4960
[5]   SENSITIVITY VERSUS TARGET BACKINGS FOR ELEMENTAL ANALYSIS BY ALPHA EXCITED X-RAY-EMISSION [J].
FLOCCHINI, RG ;
FEENEY, PJ ;
SOMMERVILLE, RJ ;
CAHILL, TA .
NUCLEAR INSTRUMENTS & METHODS, 1972, 100 (03) :397-+
[6]  
FLOCCHINI RG, 1975, ADV XRAY ANAL, V18, P579
[7]   PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS [J].
FOLKMANN, F ;
GAARDE, C ;
HUUS, T ;
KEMP, K .
NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03) :487-499
[8]   SENSITIVITY IN TRACE-ELEMENT ANALYSIS BY P, ALPHA AND O-16 INDUCED X-RAYS [J].
FOLKMANN, F ;
BORGGREEN, J ;
KJELDGAARD, A .
NUCLEAR INSTRUMENTS & METHODS, 1974, 119 (01) :117-123
[9]   INNER-SHELL IONIZATIONS BY PROTON IMPACT [J].
GARCIA, JD .
PHYSICAL REVIEW A, 1970, 1 (02) :280-&
[10]   X-RAY PRODUCTION CROSS SECTIONS [J].
GARCIA, JD .
PHYSICAL REVIEW A, 1970, 1 (05) :1402-&