ENHANCEMENT OF TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY WITH ELECTROCHEMICAL DEPOSITION

被引：7

作者：

FAN, QA ^{[1
]}

GOHSHI, Y ^{[1
]}

机构：

[1] UNIV TOKYO,FAC ENGN,DEPT IND CHEM,BUNKYO KU,TOKYO 113,JAPAN

来源：

APPLIED SPECTROSCOPY | 1993年 / 47卷 / 11期

关键词：

TOTAL REFLECTION X-RAY FLUORESCENCE; CONCENTRATION TECHNIQUE; ELECTRODEPOSITION;

D O I：

10.1366/0003702934066064

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An electrodeposition preconcentration technique was used in conjunction with total reflection x-ray fluorescence (TRXRF) analysis. Enhancement in sensitivity on the order of 10(3) was realized for the ions investigated here. to addition, x-ray scattering was reduced and a degree of selectivity was achieved by the electrodeposition. The results suggest that trace elemental analysis (sub-ppb level) with chemical speciation capability is feasible by using TRXRF with a conventional x-ray source.

引用

页码：1742 / 1746

页数：5

共 8 条

[1] PRECONCENTRATION OF RARE-EARTH QUINOLIN-8-OL COMPLEXES ONTO ACTIVATED CARBON AND DETERMINATION BY 1ST-ORDER DERIVATIVE X-RAY-FLUORESCENCE SPECTROMETRY [J].

BHAGAVATHY, V ;

REDDY, MLP ;

SAI, PST ;

RAO, TP ;

DAMODARAN, AD .

ANALYTICA CHIMICA ACTA, 1991, 242 (02) :215-220

[2] SYNCHROTRON RADIATION EXCITED X-RAY-FLUORESCENCE ANALYSIS USING TOTAL REFLECTION OF X-RAYS [J].

IIDA, A ;

YOSHINAGA, A ;

SAKURAI, K ;

GOHSHI, Y .

ANALYTICAL CHEMISTRY, 1986, 58 (02) :394-397

[3] ELECTROCHEMICAL PRECONCENTRATION OF METALS USING MERCURY FILM ELECTRODES FOLLOWED BY ELECTROTHERMAL VAPORIZATION INTO AN INDUCTIVELY COUPLED PLASMA AND DETERMINATION BY ATOMIC EMISSION-SPECTROMETRY [J].

MATUSIEWICZ, H ;

FISH, J ;

MALINSKI, T .

ANALYTICAL CHEMISTRY, 1987, 59 (18) :2264-2269

[4] MULTIELEMENT ANALYSIS OF ENVIRONMENTAL-SAMPLES BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY, NEUTRON-ACTIVATION ANALYSIS AND INDUCTIVELY COUPLED PLASMA OPTICAL-EMISSION SPECTROSCOPY [J].

MICHAELIS, W .

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1986, 324 (07) :662-671

[5] APPLICATION OF TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY TO ELEMENTAL DETERMINATIONS IN WATER, SOIL AND SEWAGE-SLUDGE SAMPLES [J].

MUKHTAR, S ;

HASWELL, SJ ;

ELLIS, AT ;

HAWKE, DT .

ANALYST, 1991, 116 (04) :333-338

[6]

Skoog D. A., 1980, PRINCIPLES INSTRUMEN

[7]

STOBEI RP, 1985, ANAL CHEM, V57, P2880

[8] OPTICAL FLATS FOR USE IN X-RAY SPECTROCHEMICAL MICROANALYSIS [J].

YONEDA, Y ;

HORIUCHI, T .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (07) :1069-&

← 1 →