MICROVOIDS IN AMORPHOUS SI1-XCX-H ALLOYS STUDIED BY SMALL-ANGLE X-RAY-SCATTERING

被引：86

作者：

WILLIAMSON, DL ^{[1
]}

MAHAN, AH ^{[1
]}

NELSON, BP ^{[1
]}

CRANDALL, RS ^{[1
]}

机构：

[1] SOLAR ENERGY RES INST,GOLDEN,CO 80401

来源：

APPLIED PHYSICS LETTERS | 1989年 / 55卷 / 08期

关键词：

D O I：

10.1063/1.101779

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：783 / 785

页数：3

共 24 条

[1]

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[2]

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[5]

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[6]

Guinier A., 1955, SMALL ANGLE SCATTERI, P30

[7]

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[8]

KUWANO Y, 1982, 16TH IEEE PV SPEC C, P1331

[9] SMALL-ANGLE X-RAY AND NEUTRON-SCATTERING STUDIES OF PLASMA-DEPOSITED AMORPHOUS SILICON-HYDROGEN FILMS [J].

LEADBETTER, AJ ;

RASHID, AAM ;

RICHARDSON, RM ;

WRIGHT, AF ;

KNIGHTS, JC .

SOLID STATE COMMUNICATIONS, 1980, 33 (09) :973-977

[10] NATURE OF THE STRUCTURAL HETEROGENEITY IN SIH FILMS BY SMALL-ANGLE NEUTRON-SCATTERING [J].

LEADBETTER, AJ ;

RASHID, AAM ;

COLENUTT, N ;

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SOLID STATE COMMUNICATIONS, 1981, 38 (10) :957-960

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