APPLICATION OF THE ISLAND BLISTER TEST FOR THIN-FILM ADHESION MEASUREMENT

[1] Allen M., 1986, THESIS MIT

[2] MICROFABRICATED STRUCTURES FOR THE INSITU MEASUREMENT OF RESIDUAL-STRESS, YOUNGS MODULUS, AND ULTIMATE STRAIN OF THIN-FILMS [J]. APPLIED PHYSICS LETTERS, 1987, 51 (04) : 241 - 243

[3] ANALYSIS OF CRITICAL DEBONDING PRESSURES OF STRESSED THIN-FILMS IN THE BLISTER TEST [J]. JOURNAL OF ADHESION, 1988, 25 (04) : 303 - 315

[4] ALLEN MG, 1988, 46TH P SOC PLAST ENG, P997

[5] ALLEN MG, 1987, P AM CHEM SOC DIVISI, V56, P735

[6] ALLEN MG, 1988, 11TH ADH SOC ANN M, P61

[7] Beams W., 1959, P INT C STRUCTURE PR, P183

[8] BROWN HR, 1987, DEC MAT RES SOC

[9] Campbell D. S., 1970, HDB THIN FILM TECHNO, P12

[10] DANNENBERG H, 1961, J APPL POLYM SCI, V5, P125, DOI DOI 10.1002/APP.1961.070051401

[1] Allen M., 1986, THESIS MIT

[2] MICROFABRICATED STRUCTURES FOR THE INSITU MEASUREMENT OF RESIDUAL-STRESS, YOUNGS MODULUS, AND ULTIMATE STRAIN OF THIN-FILMS [J]. APPLIED PHYSICS LETTERS, 1987, 51 (04) : 241 - 243

[3] ANALYSIS OF CRITICAL DEBONDING PRESSURES OF STRESSED THIN-FILMS IN THE BLISTER TEST [J]. JOURNAL OF ADHESION, 1988, 25 (04) : 303 - 315

[4] ALLEN MG, 1988, 46TH P SOC PLAST ENG, P997

[5] ALLEN MG, 1987, P AM CHEM SOC DIVISI, V56, P735

[6] ALLEN MG, 1988, 11TH ADH SOC ANN M, P61

[7] Beams W., 1959, P INT C STRUCTURE PR, P183

[8] BROWN HR, 1987, DEC MAT RES SOC

[9] Campbell D. S., 1970, HDB THIN FILM TECHNO, P12

[10] DANNENBERG H, 1961, J APPL POLYM SCI, V5, P125, DOI DOI 10.1002/APP.1961.070051401