NEAR-SURFACE STRUCTURE DETERMINATION USING X-RAY REFLECTION-ABSORPTION SPECTROSCOPY

被引：14

作者：

BORTHEN, P

STREHBLOW, HH

机构：

[1] Institut für Physikalische Chemie und Elektrochemie, Heinrich-Heine-Universität Düsseldorf, D-40225 Düsseldorf

来源：

PHYSICA B | 1995年 / 208卷 / 1-4期

关键词：

D O I：

10.1016/0921-4526(94)00859-T

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Near surface layers structure data as r, N, sigma, Delta E(0), and known phases and amplitudes as well as thickness were used for the evaluation of X-ray reflection spectra. With these data, the energy dependent index of refraction n = 1 - delta - i beta for each layer can be calculated. The application of the Fresnel theory to an assumed layer structure yields the reflectivity as a function of the energy. As an example, oxidized copper surface is discussed.

引用

页码：421 / 422

页数：2