CONVERGENT-BEAM ELECTRON-DIFFRACTION STUDY OF STRAIN MODULATION IN GAAS/INGAAS SUPERLATTICES GROWN BY METAL ORGANIC-CHEMICAL VAPOR-DEPOSITION

被引：13

作者：

FUNG, KK

YORK, PK

FERNANDEZ, GE

EADES, JA

COLEMAN, JJ

机构：

[1] CHINESE ACAD SCI,ELECTRON MICROSCOPY LAB,BEIJING,PEOPLES R CHINA

[2] UNIV ILLINOIS,COLL ENGN,MAT RES LAB,URBANA,IL 61801

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1988年 / 57卷 / 04期

关键词：

D O I：

10.1080/09500838808214711

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：221 / 227

页数：7

共 13 条

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[2]

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[3]

CHERNS D, 1987, IN PRESS ULTRAMICROS

[4]

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GAT, R ;

SCHAPINK, FW .

ULTRAMICROSCOPY, 1987, 21 (04) :389-392

[6] ELASTIC RELAXATION IN TRANSMISSION ELECTRON-MICROSCOPY OF STRAINED-LAYER SUPERLATTICES [J].

GIBSON, JM ;

HULL, R ;

BEAN, JC ;

TREACY, MMJ .

APPLIED PHYSICS LETTERS, 1985, 46 (07) :649-651

[7]

HUMPHREYS CJ, 1986, 11TH P INT C, V1, P105

[8]

Jeng S. J., 1984, Materials Letters, V2, P359, DOI 10.1016/0167-577X(84)90111-3

[9]

POUGET JP, 1978, SOLID STATE PHASE TR, P523

[10] EMS - A SOFTWARE PACKAGE FOR ELECTRON-DIFFRACTION ANALYSIS AND HREM IMAGE SIMULATION IN MATERIALS SCIENCE [J].

STADELMANN, PA .

ULTRAMICROSCOPY, 1987, 21 (02) :131-145

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