OBSERVATION OF MICRODIFFRACTION PATTERNS WITH A DEDICATED STEM INSTRUMENT

被引：8

作者：

COWLEY, JM

OU, HJ

机构：

来源：

JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1989年 / 11卷 / 02期

关键词：

D O I：

10.1002/jemt.1060110209

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：143 / 154

页数：12

共 36 条

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[2] BUTLER JH, 1984, ULTRAMICROSCOPY, V12, P39, DOI 10.1016/0304-3991(83)90303-0
[3] BUTLER JH, 1981, 39TH P ANN M EMSA, P308
[4] Chapman J. N., 1980, Electron Microscopy and Analysis, 1979, P77
[5] COWLEY JM, 1981, ULTRAMICROSCOPY, V6, P359, DOI 10.1016/S0304-3991(81)80237-9
[6] COHERENT INTERFERENCE IN CONVERGENT-BEAM ELECTRON-DIFFRACTION AND SHADOW IMAGING
COWLEY, JM
[J]. ULTRAMICROSCOPY, 1979, 4 (04) : 435 - 450
[7] THE STEM APPROACH TO THE IMAGING OF SURFACES AND SMALL PARTICLES
COWLEY, JM
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1983, 129 (MAR): : 253 - 261
[8] NANODIFFRACTION FROM PLATELET DEFECTS IN DIAMOND
COWLEY, JM
OSMAN, MA
HUMBLE, P
[J]. ULTRAMICROSCOPY, 1984, 15 (04) : 311 - 318
[9] COHERENT INTERFERENCE EFFECTS IN SIEM AND CBED
COWLEY, JM
[J]. ULTRAMICROSCOPY, 1981, 7 (01) : 19 - 26
[10] ELECTRON-DIFFRACTION PHENOMENA OBSERVED WITH A HIGH-RESOLUTION STEM INSTRUMENT
COWLEY, JM
[J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1986, 3 (01): : 25 - 44