MICROWAVE-POWER ABSORPTION BY THALLIUM-BASED SUPERCONDUCTORS ON METALLIC SUBSTRATES

被引:9
作者
COOKE, DW [1 ]
ARENDT, PN [1 ]
GRAY, ER [1 ]
BENNETT, BL [1 ]
BROWN, DR [1 ]
ELLIOTT, NE [1 ]
REEVES, GA [1 ]
ROLLETT, AD [1 ]
HUBBARD, KM [1 ]
PORTIS, AM [1 ]
机构
[1] UNIV CALIF BERKELEY,BERKELEY,CA 94720
关键词
D O I
10.1063/1.104300
中图分类号
O59 [应用物理学];
学科分类号
摘要
Tl-based superconducting thick films deposited on large-area (11.4 cm2) Ag alloy (Consil 995) substrates have been characterized by surface resistance measurements yielding values of 4 and 14 m-OMEGA at 4 and 77 K, respectively, as measured in an 18 GHz Cu cavity; corresponding Cu values are 8 and 21 m-OMEGA. Utilizing a Nb cavity, the dependence of surface resistance on microwave power was also measured. The surface resistance begins to rise in microwave magnetic fields of 1-10 Oe and saturates in 20-60 Oe, the exact values depending on the degree of c-axis texturing of the polycrystalline films. Enhanced texturing sharpens the high-frequency transition into the superconducting state and also weakens the dependence of surface resistance on microwave magnetic field. These results are significant for high temperature superconductor applications such as microwave cavities.
引用
收藏
页码:1329 / 1331
页数:3
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