Indium-induced layer-by-layer growth and suppression of twin formation in the homoepitaxial growth of Cu(111)

被引:63
作者
vanderVegt, HA [1 ]
Alvarez, J [1 ]
Torrelles, X [1 ]
Ferrer, S [1 ]
Vlieg, E [1 ]
机构
[1] EUROPEAN SYNCHROTRON RADIAT FACIL,F-38043 GRENOBLE,FRANCE
来源
PHYSICAL REVIEW B | 1995年 / 52卷 / 24期
关键词
D O I
10.1103/PhysRevB.52.17443
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have investigated the effect of In on the homoepitaxial growth of Cu(111) by means of surface x-ray diffraction. At the temperature range investigated (125-300 K), the growth on clean Cu occurs in a three-dimensional mode with the creation of twin crystallites over a small fraction of the total surface area. When the surface is precovered with a submonolayer amount of In, layer-by-layer growth is induced and the formation of twin crystallites is suppressed.
引用
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页码:17443 / 17448
页数:6
相关论文
共 18 条
[1]  
BREEMAN M, IN PRESS THIN SOLID
[2]   SURFACTANT-INDUCED SUPPRESSION OF TWIN FORMATION DURING GROWTH OF FCC CO/CU SUPERLATTICES ON CU(111) [J].
CAMARERO, J ;
SPENDELER, L ;
SCHMIDT, G ;
HEINZ, K ;
DEMIGUEL, JJ ;
MIRANDA, R .
PHYSICAL REVIEW LETTERS, 1994, 73 (18) :2448-2451
[3]  
DASTOOR PC, 1994, SURF REV LETT, V1, P509
[4]  
EHRLICH G, 1966, J CHEM PHYS, V44, P1030
[5]   ORIGIN OF OXYGEN-INDUCED LAYER-BY-LAYER GROWTH IN HOMOEPITAXY ON PT(111) [J].
ESCH, S ;
HOHAGE, M ;
MICHELY, T ;
COMSA, G .
PHYSICAL REVIEW LETTERS, 1994, 72 (04) :518-521
[6]   SURFACE DIFFRACTION BEAMLINE AT ESRF [J].
FERRER, S ;
COMIN, F .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02) :1674-1676
[7]  
Henzler M., 1994, STRUCTURE SURFACES, VIV, P619
[8]   ANGLE CALCULATIONS FOR A 6-CIRCLE SURFACE X-RAY DIFFRACTOMETER [J].
LOHMEIER, M ;
VLIEG, E .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1993, 26 :706-716
[9]   EPITAXIAL-GROWTH OF THIN COPPER LAYERS ON CU(111) STUDIED BY HIGH-RESOLUTION LOW-ENERGY-ELECTRON-DIFFRACTION [J].
MEYER, G ;
WOLLSCHLAGER, J ;
HENZLER, M .
SURFACE SCIENCE, 1990, 231 (1-2) :64-75
[10]   NEW PHENOMENA IN HOMOEPITAXIAL GROWTH OF METALS [J].
POELSEMA, B ;
KUNKEL, R ;
NAGEL, N ;
BECKER, AF ;
ROSENFELD, G ;
VERHEIJ, LK ;
COMSA, G .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1991, 53 (05) :369-376