ATOMIC-FORCE MICROSCOPY

[1] BINNIG G, 1986, IBM J RES DEV, V30, P355

[2] ATOMIC FORCE MICROSCOPE [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933

[3] BINNIG G, 1987, EUROPHYS LETT, V3

[4] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834

[5] DURIG U, 1986, JUL STM 86 C SANT CO

[6] STUDY OF SURFACE-TOPOGRAPHY IN IMPACT-WEAR [J]. WEAR, 1982, 75 (02) : 423 - 442

[7] THE TUNNELING MICROSCOPE - A NEW LOOK AT THE ATOMIC WORLD [J]. SCIENCE, 1986, 232 (4746) : 48 - 53

[8] SURFACE-ROUGHNESS MEASUREMENTS OF LOW-SCATTER MIRRORS AND ROUGHNESS STANDARDS [J]. APPLIED OPTICS, 1984, 23 (21): : 3820 - 3836

[9] MCCLELLAND GM, 1987, IN PRESS REV PROG QU, V6

[10] NIKSCH M, IN PRESS

[1] BINNIG G, 1986, IBM J RES DEV, V30, P355

[2] ATOMIC FORCE MICROSCOPE [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933

[3] BINNIG G, 1987, EUROPHYS LETT, V3

[4] IMAGING IN REAL-TIME WITH THE TUNNELING MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1986, 48 (13) : 832 - 834

[5] DURIG U, 1986, JUL STM 86 C SANT CO

[6] STUDY OF SURFACE-TOPOGRAPHY IN IMPACT-WEAR [J]. WEAR, 1982, 75 (02) : 423 - 442

[7] THE TUNNELING MICROSCOPE - A NEW LOOK AT THE ATOMIC WORLD [J]. SCIENCE, 1986, 232 (4746) : 48 - 53

[8] SURFACE-ROUGHNESS MEASUREMENTS OF LOW-SCATTER MIRRORS AND ROUGHNESS STANDARDS [J]. APPLIED OPTICS, 1984, 23 (21): : 3820 - 3836

[9] MCCLELLAND GM, 1987, IN PRESS REV PROG QU, V6

[10] NIKSCH M, IN PRESS