SURFACE AND INTERFACE ANALYSIS BY NONRESONANT MULTIPHOTON IONIZATION OF SPUTTERED NEUTRALS

被引：14

作者：

PALLIX, JB

GILLEN, KT

BECKER, CH

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 33卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(88)90709-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：912 / 917

页数：6

共 32 条

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GILLEN, KT .

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[4] SURFACE-ANALYSIS BY NONRESONANT MULTIPHOTON IONIZATION OF DESORBED OR SPUTTERED SPECIES [J].

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[5]

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[6]

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[7]

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[8]

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[9]

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[10] ION MICROPROBE MASS-SPECTROMETRY USING SPUTTERING ATOMIZATION AND RESONANCE IONIZATION [J].

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